Yttrium nitride

Yttrium nitride
Yttrium nitride
Yttrium nitride
Identifiers
3D model (JSmol)
ECHA InfoCard 100.042.939 Edit this at Wikidata
EC Number
  • 247-248-8
  • InChI=1S/N.Y
    Key: AJXBBNUQVRZRCZ-UHFFFAOYSA-N
  • [Y+3].[N-3]
Properties
YN
Molar mass 102.913 g/mol
Appearance black crystalline
Density 5.60 g/cm3
Melting point ~3033K (2760°C; 5000°F)
soluble
Structure
cubic, cF8
Fm3m, No. 225
Hazards
GHS labelling:
GHS02: FlammableGHS05: Corrosive
Danger
H228, H314
P210, P240, P241, P260, P264, P280, P301+P330+P331, P303+P361+P353, P304+P340, P305+P351+P338, P310, P321, P363, P370+P378, P405, P501
Safety data sheet (SDS) External MSDS
Related compounds
Other anions
Yttrium phosphide
Yttrium(III) arsenide
Yttrium(III) antimonide
Other cations
Scandium nitride
Lutetium nitride
Except where otherwise noted, data are given for materials in their standard state (at 25 °C [77 °F], 100 kPa).
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Yttrium nitride, YN, is a nitride of yttrium.

Yttrium nitride is hard ceramic material similar to titanium nitride and zirconium nitride. Under ambient conditions, rock salt phase of YN stablizes and its lattice constant is 4.88 Å.[1]

Yttrium nitride shows similar semiconducting properties as the nitrides of lanthanum, scandium. In its rock salt structure, YN exhibits an indirect bandgap in the range of 0.9-1.3 eV.[2]

Additionally the lattice structure of YN differs only by 8% from that of gallium nitride. This makes YN a possible buffer layer between a substrate and the GaN layer during GaN crystal growth.

References

[edit]
  1. ^ Rowberg, A. J. E.; Mu, S.; Swift, M. W.; Van de Walle, C. G. (2021-09-07). "Structural, electronic, and polarization properties of YN and LaN". Physical Review Materials. 5 (9) 094602. doi:10.1103/PhysRevMaterials.5.094602.
  2. ^ Ramírez-Montes, Luz; López-Pérez, William; González-García, Alvaro; González-Hernández, Rafael (March 2016). "Structural, optoelectronic, and thermodynamic properties of Y $$_x$$ x Al $$_{1-x}$$ 1 - x N semiconducting alloys". Journal of Materials Science. 51 (6): 2817–2829. doi:10.1007/s10853-015-9590-z. ISSN 0022-2461.